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4F., No.82, Luke 5th Rd., Luzhu Dist., Kaohsiung City 821, Taiwan (R.O.C.)
Tel: 886-7-6955325
Fax: 886-7-6955326
Angle Adjustable Reflection Measurement System
Model: L
Category: Automatic/Industrial Machines & Equipments / Testing Equipment / Inspecting/Measuring Instrument and Parts
Characteristics
Measurable spectral range: 380~1100nm, 280~1050nm, 900~1600nm
Automatic calibration function
Reflectance measurement of single incident and reflection angle by program control
Reflectance scanning measurement of single incident and reflection angle range by program control
Measure and analysis of reflection / diffuse ratio measurement dependence on wavelength
Conducting film thickness calculation of single layer
Database record for history tracing
The system can be expanded to measure the transmission and absorbance
With the rotating platform to measure 3D full-angle reflection and diffuse reflection curve
iApplication in other fieldj
Spectrum measurement of meta-material sample under different p-
olarization
Spectrum measurement of the angle dependence on anisotropy film or crystalline sample
Spectrum measurement of the angle dependence on surface plasmon polaritons (SPP) and surface plasmon resonance (SPR)
Specifications
Angle Adjustable Reflection Measurement System
This system is designed for 2D full-angle specular and diffuse reflection measurement automatically, including the sample surface or films’ specular reflectance, angle-indecent scattering measurement, wavelength-dependent analysis. This system also can be applied in film thickness analysis, surface roughness, etc. With the design of rotating platform to expand in 3D full-angle measurement system, it also can expand for reflection- transmission-absorbance measurement in one system. This system is usually be applied in semiconductor, 2D or 3D material, photoconductor, solar energy, LED, panel, coating and relative industries.
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