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4F., No.82, Luke 5th Rd., Luzhu Dist., Kaohsiung City 821, Taiwan (R.O.C.)
Tel: 886-7-6955325
Fax: 886-7-6955326
Photoluminescence Image System
Model: LSPL-R
Category: Automatic/Industrial Machines & Equipments / Testing Equipment / Inspecting/Measuring Instrument and Parts
Characteristics
•Qualitative analysis of 2D PL intensity distribution
• The PL image can estimate the two-dimensional distribution image , the bar graph distribution, the maximum & minimum values, the average value and the standard deviation of solar cell implied Voc
• For different solar cells, the impeded Voc average trend is consistent with internal open circuit voltage meter, or the carrier lifetime meter measured implied Voc.
• Controllable adjustment related parameters of camera
• Can set the ROI image area
• Format of output image: JPEG, BMP, TXT., RAW Data etc.
• With Video/Image mode
• According to different types of solar cells, you can also get the Jo, Rs two-dimensional distribution with the appropriate algorithm (Optional)
• Depth resolved uniformity with different light source (wavelength) for instance, the III-V multi-junction solar cell can reveal the uniformity distribution of different absorption layer depths
• Defect inspection of absorber material (Optional)
• Integration of temperature control platform (Optional)
• Light Induced Degradation (LID) investigation(Optional)
• Combo system with EL Image measurement for series resistance (Rs) analysis (Optional)
• Dark current-voltage (IV) curve measurement and analysis parameters extraction (Optional)
• Integration of EL spectrum modules (Optional)
Specifications
Photoluminescence Image System
By measuring and analyzing of photoluminescence images will help to understand the uniformity and defect distribution of solar cells/modules in early to promote yield and process adjustment on the production line. The PL intensity of the solar cell can reveal the maximum open circuit voltage Voc of the absorption layer. Also by different wavelength excitation, PL intensity can reveal the uniformity distribution of different absorption layer depths. Local or regional dark spots will reveal the distribution of defects / shunting points. In addition to solar cell detection, this technology can also be used in semiconductor materials LED and materal research etc.
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Photoluminescence Image System
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