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Photo-Luminescence and Efficiency Measurement System

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Photo-Luminescence and Efficiency Measurement System

Model: LSQY-R

Category: Automatic/Industrial Machines & Equipments / Testing Equipment / Inspecting/Measuring Instrument and Parts

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Characteristics

● Having the function of measuring optical and electrical characteristic of LED/OLED or
other luminescent materials, providing test statistics report and analyzing tool.
● The system is modular design, it can make the customized according to the requirement
of customer and achieve multiplex function.
● Base on the customer's sample type, it can be combined with different sizes and
functions of PTFE integrating sphere.
● With the standard lamp or sample, the user can correct by themselves, no need to
charge other calibration fees.
● Base on the customer's sample type, and design a variety of LED or sample fixture,
probe station and thimble jig.
● It can match different of multimeter, such as: Keithley 24XX, Agilent B29XX, ADCMT
6240, GW etc.
● Multiple measurement modes in software: general mode, pulse mode,
and temperature control mode (integration of temperature control plaform)
● Compatible with various signal gains module, it not only can measure
a bigger dynamic range of brightness, but also the high and low luminance
● Integration of the temperature controlled stage for testing the changes of illuminated parameter on the temperature, also extracting the junction temperature (Option)
● Expand the illuminated image (EL) and the distribution of luminous intensity (Option).
● Expand the PLQY function of illuminated material measurement (Option)

Specifications

Photo-Luminescence and Efficiency Measurement System

The system provides the best solutions for measuring LED, OLED, solar cell, photodiode and various light emitting materials. It can measure quantum efficiency, emission spectrum, I-V curve, lifetime, stability and related features such us: starting voltage (Vf)、luminous efficiency (lm/W) 、luminous intensity (cd) 、CIE, LIV and analysis of emission spectrum (bandgap of semiconductor, junction temperature etc). The system also can be extend for EL image of LED、PLQY and PL spectrum of light emitting materials.

Item Specification Content

System Hardware

1. High sensitivity spectroscope

(a) Wavelength range: 300~1100nm

(b) Wavelength resolution: ~1.5nm

(d) A/D resolution: 16 bits

(e) Light received efficiency: Because of increasing the optical design of cylinder lenses, spectrometer sensitivity will be six times higher than normal fiber.

2. Integrating sphere

(a) The surface anodic treatment by aluminum alloy

(b) The main material of the inner wall coating is pure barium sulfate, which has good chemical stability, meets CIE requirements, has good and slow reflection, and has a reflectivity of ±96±2 % (380-1100 nm).

(d) Internal diameter: 10cm (standard configuration), it can be matched according to customer's requirement, and set on different sizes or opening sizes.

3. Electric meter:

According to customer needs, electric meter can match with different measurement range and resolution, such as Keithley 24XX, AglientB29XX, ADCM 6240, GW, etc.

4. Light intensity detector:

Si (200~1100nm)

Other Optional: InGaAs (1000~2000nm), Ge (900~1800nm)

5. Sample Carrier:

(a) Base on the customer's sample type, and design a variety of LED or sample fixture, probe station and thimble jig.

(b) two or four wires of Binding Posts

Measuring Software

1. Multiple software measurement modes: General mode, impulses mode, and temperature control mode (For example: Temperature Control Stage)

(a) General mode: Under fixed temperature and power supply conditions, measuring optical parameter voltage.

(b) Impulses mode: Under fixed temperature condition, set up the power supply operating conditions and measuring the related between light parameters and power supply operating conditions (such as L-I-V)

(c) Temperature control mode: Under fixed temperature condition, setting up the different temperature and measuring the related between light parameters and temperature.

2. Forward bias voltage (forward current, Vf) Measurement

3. Quantum efficiency (Lum/W) Measurement

4. Light intensity (Luminous intensity, cd) Measurement

5. Luminous flux (Luminous, lm) Measurement

6. Dominant wavelength, Peak wavelength Measurement and FWHM

7. Chromaticity coordinates (x, y), (u', v') Measurement

8. LIV curve

9. Database function

10. Format of data saving

11. Format of data saving txt & jpg file

Shielding Camera Obscura

1. Opening dodge gate

2. With the function of electromagnetic shielding

Other Optional

1. Expand the temperature-controlled sample stage for testing the changes of illuminated parameter on the temperature, extracting the junction temperature (Optional)

2. Expand the illuminated image (EL) and the distribution of luminous intensity (Optional).

3. Expand the PLQY function of illuminated material measurement (Optional).

4. Microscope observation platform.

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