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4F., No.82, Luke 5th Rd., Luzhu Dist., Kaohsiung City 821, Taiwan (R.O.C.)
Tel: 886-7-6955325
Fax: 886-7-6955326
PL & EL Luminescence Spectrum System
Model: LSLS-R
Category: Automatic/Industrial Machines & Equipments / Testing Equipment / Inspecting/Measuring Instrument and Parts
Characteristics
• Analysis of material band gap and defect energy level
• FWHM calculation of EL/PL spectrum
• Time-resolved application for transient response measurement (optional)
• Integration of Laser Scanning Confocal Microscopy to map 2D PL image
(optional)
• Integration of bias voltage and bias light to modulate the test device under
different operation condition (optional)
• Integration of temperature control platform to analyze the temperature co-
efficient of band gap (optional)
• Evaluation of surface recombination velocity by a set of laser source
(optional)
• Temperature coefficient measurement of band gap (optional)
• Evaluation of surface recombination velocity by a set of Laser source (optional)
• Light induced degradation (LID) investigation (optional)
• Dark current-voltage (IV) curve measurement and parameters extraction
(optional)
Specifications
PL & EL Luminescence Spectrum System
The luminescence spectrum (EL/PL) measurement system is a powerful metrology of optoelectronics device or material characterization. There are many kinds of photovoltaic components, the main applications are LED, solar cell, and light detector… etc. Their material characteristic is highly correlated to the luminescence mechanism. They will have different photovoltaic characteristics and spectral effects no matter if it’s from single PN junction to multi-junction, or from intrinsic junction to heterojunction, or from surface microstructure to active layer nanometer structure.
- Electroluminescence Spectrum ( EL )
Condition of Injection Current →Programmable →CW Mode/ Pulse Mode |
The bandgap and junction temperature could be calculated with electron-hole-plasma recombination model. The defect incorporation with specific energy level and density could be further investigated. The frequency response can also be tested by pulse current modulation as well as lock-in technology. The optional measurement program is also available for long-term reliability investigation.
- Photoluminescence Spectrum (Fluorescence)
Laser Excitation Source→ Option →Stead State/ Modulated at Specific Frequency |
The frequency response can be tested by pulse Laser modulation as well as lock-in technology.The excitation photon energy (wavelength) and power density can be chosen for depth resolved investigation and injection level dependent optical transition mechanism. The dependence of excitation conditions (photon energy, power density, and modulation frequency) and environments (temperature and device morphology) can help to identify numbers of optical device or materials.
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Spectral Response / Quantum Efficiency Measurement System
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Photo-Luminescence and Efficiency Measurement System
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Reference Solar Cell
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Laser Beam Induced Current / Voltage (LBIC/LBIV) Measurement System
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PL & EL Luminescence Spectrum System
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Photoluminescence Image System
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Raman Spectrum Measurement System