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4F., No.82, Luke 5th Rd., Luzhu Dist., Kaohsiung City 821, Taiwan (R.O.C.)
Tel: 886-7-6955325
Fax: 886-7-6955326
Angle Adjustable Reflection Measurement System
Model: µL
Category: Automatic/Industrial Machines & Equipments / Testing Equipment / Inspecting/Measuring Instrument and Parts
Characteristics
¡´ Measurable spectral range: 380~1100nm, 280~1050nm, 900~1600nm
¡´ Automatic calibration function
¡´ Reflectance measurement of single incident and reflection angle by program control
¡´ Reflectance scanning measurement of single incident and reflection angle range by program control
¡´ Measure and analysis of reflection / diffuse ratio measurement dependence on wavelength
¡´ Conducting film thickness calculation of single layer
¡´ Database record for history tracing
¡´ The system can be expanded to measure the transmission and absorbance
¡´ With the rotating platform to measure 3D full-angle reflection and diffuse reflection curve
¡iApplication in other field¡j
¡´ Spectrum measurement of meta-material sample under different p-
olarization
¡´ Spectrum measurement of the angle dependence on anisotropy film or crystalline sample
¡´ Spectrum measurement of the angle dependence on surface plasmon polaritons (SPP) and surface plasmon resonance (SPR)
Specifications
Angle Adjustable Reflection Measurement System
This system is designed for 2D full-angle specular and diffuse reflection measurement automatically, including the sample surface or films’ specular reflectance, angle-indecent scattering measurement, wavelength-dependent analysis. This system also can be applied in film thickness analysis, surface roughness, etc. With the design of rotating platform to expand in 3D full-angle measurement system, it also can expand for reflection- transmission-absorbance measurement in one system. This system is usually be applied in semiconductor, 2D or 3D material, photoconductor, solar energy, LED, panel, coating and relative industries.
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